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Laboratory Management System Records

LAB ID FLEXAUTOMOTIVE (EMC)
ACCREDITATION
TEST TITLE LIMITATIONS
TRD-13-0047 Rev-8 BRP Skidoo LE/HE Load Simulator & CAN bus config
TRD-13-0047 Rev-8 SHORT CIRCUIT (26.0)
ACCREDITATION A2LA
TEST TITLE LIMITATIONS
705304-101 ESD Target Verification
705304-102 ESD Voltage Verification
705304-110 Conducted Transient Emissions
705304-112 Conducted Transient Immunity Pulse#2a
705304-113 Conducted Transient Immunity Pulse#2b
705304-114 Conducted Transient Immunity ISO Pulse#3a,3b
705304-115 Conducted Transient Immunity Pulse#4
705304-116 Conducted Transient Immunity Pulse#5
705304-120 Magnetic Field Immunity Helmholtz Coil
705304-250 CISPR-25 Radiated Emissions Ambient
705304-251 CISPR-25 Conducted Emissions Voltage Ambient on B+ & Gnd
705304-252 CISPR-25 Conducted Emissions Current Ambient @ 5cm & 75cm
705304-253 CISPR-25 Antenna Factor Update/Verification Tile Data (LMS005/201756)
705304-254 CISPR-25 RE/CE Cable Loss & Preamp Update/Verification Tile Data (LMS005/201756)
705304-255 CISPR-25 CEI Current Probe Calibration Factors Update/Verification Tile Data (LMS005/201756)
705304-256 Hand Portable Transmission Test Setup Characterization Substitution Method FWD power (LMS005/201756)
705304-257 ALSE RF Immunity Test Setup Characterization Substitution Method for FWD power (LMS005/201756)
705304-258 TEM Cell Test Setup Characterization Substitution Method for FWD power (LMS005/201756)
705304-259 ALSE/TEM Field Probe Factor Update/Verification Tile data (LMS005/201756)
705304-260 ALSE/TEM/HND PORT Directional Coupler & Cable Loss Update/Verification Tile data (LMS005/201756)
705304-261 BCI Test Setup Characterization Substitution Method for FWD power calibration jig (LMS005/201756)
705304-262 Supply Voltage Ripple test setup characterization and verification for injected signal level (LMS005/201756)
705304-263 Transients (all OEMs) verification of pulse parameters in open & load conditions (LMS005/201756)
705304-264 CISPR-25 RE/CEV/CEI Comb Generator Verification
705304-301 Test Plan (LMS002/LMS004)
705304-302 DTCO Test Request (form 201696)
705304-303 External Test Request (form 201695)
705304-304 Test Report (LMS002)
705304-305 Technical Audit
A2LA Peformance History ESD pulse target verification
AEMCLRP - ALSE RF Immunity (ISO11452-2:2004)
AEMCLRP - BCI calibration JIG (GM, Ford, Chrysler)
AEMCLRP - BCI OEM artifact testing
AEMCLRP - CE Current ambient (Chrysler)
AEMCLRP - CE Voltage ambient (GM, Ford, Chrysler)
AEMCLRP - ESD Target Verification
AEMCLRP - ESD Voltage Verification
AEMCLRP - RE ALSE ambient (GM, Ford, Chrysler)
AEMCLRP ALSE PROFICIENCY TESTING
AEMCLRP BCI PROFICIENCY TESTING
AEMCLRP CEI PROFICIENCY TESTING
AEMCLRP CEV PROFICIENCY TESTING
AEMCLRP ESD Proficiency Testing
Amendments to test reports and calibration certificates
Assuring the quality of test and calibration results
Assuring the quality of test and calibration results - correct the problem and to prevent incorrect results from being reported
Assuring the quality of test and calibration results - quality control procedures for monitoring the validity of tests and calibrations
Calibration certificates - environmental, uncertainty, traceability
Calibration certificates - no recommendation on the calibration interval
Calibration certificates - statement of compliance
Calibrations - before and after instrument adjustment or repair
CISPR-25:2008 (6.2) Conducted emissions from components/modules – Voltage method
CISPR-25:2008 (6.3) Conducted emissions from components/modules – current probe method
CISPR-25:2008 (6.4) Radiated emissions from components/modules - ALSE method
Complaints
Control of data
Control of data - appropriate checks
Control of data - handling calibration data
Control of nonconforming testing and/or calibration work
Control of records
Corrective Action
CS-11979:2010 (6.4.1) Transient Immunity of Supply Lines
CS-11979:2010 (6.4.2) Transient Immunity of I/O or Sensor Lines – Coupling Clamp
Electronic module sensitivity classification for packaging and handling (unpowered test)
Electronic transmission of test or calibration results
Equipment
Equipment - accuracy verification prior to use
Equipment - calibration correction factors procedure
Equipment - calibration labels
Equipment - compliance to requirements
Equipment - handling, storage, maintenance procedure
Equipment - intermediate checks procedures
Equipment - operator instructions
Equipment - out of service
Equipment - records
Equipment - return from service verification
Equipment - safeguarded from adjustments
Equipment - uniquely identified
Estimation of uncertainty of measurement
Estimation of uncertainty of measurement - appropriate methods of analysis
Estimation of uncertainty of measurement - lab procedure per calibration type
Estimation of uncertainty of measurement - lab procedure per test method
Format of reports and certificates
General (Test and calibration methods and method validation)
Handling of test and calibration items
Handling of test and calibration items - avoiding deterioration, loss or damage to the test or calibration item
Handling of test and calibration items - identifying system
Handling of test and calibration items - procedures
Handling of test and calibration items - suitability, conformance to description provided
Improvement
Internal audits
ISO 16750-2 (2010) 4.12 Insulation resistance
ISO 16750-2:2012 (4.10.2) Short circuit protection on Signal Lines
ISO 16750-2:2012 (4.10.3) Short circuit protection on Load Lines
ISO 16750-2:2012 (4.11) Withstand voltage
ISO 16750-2:2012 (4.12) Insulation resistance
ISO 16750-2:2012 (4.2) Direct current supply voltage range (12/24V)
ISO 16750-2:2012 (4.3) Overvoltage (18V for 60 min @Tmax-20 C & @ Troom 12/24V)
ISO 16750-2:2012 (4.4) Superimposed alternating voltage (severity 1-4, 12/24V)
ISO 16750-2:2012 (4.5) Slow decrease and increase of supply voltage (0V to Usmin @ 0.5V/min)
ISO 16750-2:2012 (4.6.1) Momentary drop in supply voltage (Usmin to 4.5V/12V; 9V/24V)
ISO 16750-2:2012 (4.6.2.2) Discontinuities in supply voltage - Reset behaviour at voltage drop
ISO 16750-2:2012 (4.6.2.3) Discontinuities in supply voltage - Starting Profile
ISO 16750-2:2012 (4.6.4) Load Dump (P5a/P5b)
ISO 16750-2:2012 (4.7) Reversed voltage
ISO 16750-2:2012 (4.8) Ground reference and supply offset
ISO 16750-2:2012 (4.9) Open circuit tests (Single/Multiple Line Interruptions)
ISO 7637-2:2004 Transient Immunity Supply Lines (Pulse 5a)
ISO 7637-2:2004 Transient Immunity Supply Lines (Pulse 5b)
ISO 7637-2:2004 Transient Immunity Supply Lines (Pulses 1,2a, 2b, 3a, 3b,4, 5a,5b)
ISO 7637-2:2004 Voltage Transient Emissions
ISO-10605:2001 Test procedure for electronic modules (powered-up test)
ISO-10605:2008 Component immunity test method (powered-up test)
ISO-10605:2008 Component packaging and handling test method (unpowered test)
ISO-11451-3:2007 On Board Transmitters - Annex B Guidance on tuning antennas on the vehicle for minimum voltage standing wave ratio (VSWR)
ISO-11452-2:2004 (8.3.1) RI ALSE Substitution method
ISO-11452-2:2004 (8.3.2) RI ALSE Field calibration
ISO-11452-4:2005 Bulk current injection (BCI 1 MHz to 400 MHz)
ISO-11452-8:2007 (5.2.2) Field generating device - Helmholtz coil
ISO-16750-2 (2010) 4.11 Withstand voltage
ISO-7637-2:2004 - Transient Immunity Supply Lines Test Pulse 1
ISO-7637-2:2004 - Transient Immunity Supply Lines Test Pulse 2a
ISO-7637-2:2004 - Transient Immunity Supply Lines Test Pulse 2b
ISO-7637-2:2004 - Transient Immunity Supply Lines Test Pulse 3a
ISO-7637-2:2004 - Transient Immunity Supply Lines Test Pulse 4
ISO-7637-2:2004 Transient Immunity Supply Lines Test Pulse 3b
ISO-7637-2:2011 (4.3) Voltage transient emissions test (slow/fast pulses)
ISO-7637-2:2011 (4.4) Transient immunity test (P1, P2a, P2b, P3a, P3b)
ISO-7637-2:2011 (5.6.1) Test pulse 1
ISO-7637-2:2011 (5.6.2) Test pulses 2a and 2b
ISO-7637-2:2011 (5.6.3) Test pulses 3a and 3b
ISO-7637-3:2007 (3.4.2) Capacitive coupling clamp (CCC) method
ISO-7637-3:2007 3.4.3 Direct capacitor coupling (DCC) method
Laboratory-developed methods
Management reviews
MBN 10284-2:2011 (06) RF Emissions – Artificial Network Measurements (AN-Test) CISPR 25:2008 (6.2) 0.15 to 108 MHz
MBN 10284-2:2011 (07) RF Emissions - Capacitive Voltage Measurement (CV-Test)
MBN 10284-2:2011 (08) 8 RF Emissions – Antenna Measurements (RE-Test) CISPR-25:2008 (6.4) 0.15 MHz to 2690 MHz
MBN 10284-2:2011 (09) Transient Emissions on Supply lines (CTE-Test) ISO 7637-2:2011 fast pulses
MBN 10284-2:2011 (12) RF Immunity – Bulk Current Injection (BCI-Test) ISO 11452-4:2010 Substitution Method, 0.1 to 400 MHz
MBN 10284-2:2011 (12) RF Immunity – Bulk Current Injection (BCI-Test) ISO 11452-4:2010 Substitution Method, 0.1 to 400 MHz
MBN 10284-2:2011 (13) RF Immunity – Antenna Irradiation (ALSE-Test) ISO 11452-2: 2004 (200 MHz to 3 GHz)
MBN 10284-2:2011 (14) Magnetic Field Immunity (LFM-Test) ISO 11452-8: 2007 15 Hz to 30 KHz
MBN 10284-2:2011 (15) Transients on Supply Lines (TSUP-Test), ISO 7637-2: 2011 Pulses #1, #1b, #2a, #3a, #3b
MBN 10284-2:2011 (16) Transients on Lines except Supply Lines (TOL-Test) ISO 7637-2:2011 CCC & ICC , Fast & Slow Pulses
MBN 10284-2:2011 (17) Electrostatic Discharge – Handling Test (ESDH-Test) ISO 10605: 2008
MBN 10284-2:2011 (18) Electrostatic Discharge (Powered Up) – Direct Discharge (ESDD-Test) ISO 10605: 2008
MBN 10284-2:2011 (19) Electrostatic Discharge (Powered Up) – Indirect Discharge (ESDI-Test) ISO 10605: 2008 Annex-F
MBN LV124-1:2013 (6.05) E-05 Load dump
MBN LV124-1:2013 (6.06) E-06 Superimposed alternating voltage
Measurement traceability
Measurement traceability - Calibration
Measurement traceability - Calibration traceable to the International System of Units (SI)
Measurement traceability - General
Measurement traceability - Intermediate checks
Measurement traceability - Reference materials
Measurement traceability - Reference Materials, interlaboratory comparisons
Measurement traceability - Reference standards
Measurement traceability - Reference standards and reference materials
Measurement traceability - Specific requirements
Measurement traceability - Testing
Measurement traceability - Testing certified reference materials, agreed methods and/or consensus standards
Measurement traceability - Testing equipment used can provide the uncertainty of measurement
Measurement traceability - Transport and storage
Non-standard methods
Opinions and interpretations
Preventive action
Purchasing services and supplies
Reporting the results - General
Review of requests, tenders and contracts
SAE-J1113-04 Bulk Current Injection, Appendix A/Figure A.1
SAE-J1113-04:2004 (R) Immunity to Radiated Electromagnetic Fields-Bulk Current Injection (BCI) Method
SAE-J1113-13:2004 (4) ESD Powered Mode Component Tests
SAE-J1113-21:2005 RI ALSE with a Ground Plane
SAE-J1113-22:2003 (6.3.2) lmmunity to Radiated Magnetic Fields - Helmholtz Coil Method
SAE-J1113-41 (5.2.1) CISPR-25 Conducted RF Emissions - Voltage on Supply Lines (0.150 to 108 MHz)
SAE-J1113-41 (5.2.2) CISPR-25 Conducted RF Emissions - Current on all Lines in Harness (0.150 to 108 MHz)
SAE-J1113-41 (7) CISPR-25 RE, Absorber Lined Shielded Enclosure (ALSE) 0.150 - 960 MHz
SAE-J1113-41 Radiated Emissions ALSE Sections 4, 4.4
SAE-J1113-42 (5) Conducted Transient Emissions (+100 V, -150 V, +200 V, -600 V)
Sampling
Sampling - customer requested deviations
Sampling - plan and procedures
Sampling - procedures for recording relevant data and operations
Selection of methods
Service to the customer
Subcontracting of tests and calibrations
Technical records
Test reports - interpretation of the test results
Test reports - sampling
Test reports and calibration certificates
Testing and calibration results obtained from subcontractors
TRD-13-0047 Rev-8 25. ELECTROSTATIC DISCHARGE SAE 1113-13
TRD-13-0047 Rev-8 BRP Skidoo LE/HE Test Report
TRD-13-0047 Rev-8 VOLTAGE TRANSIENTS (13.0) SAE J1113-11
TRD-13-0060-2 (CISPR-25:2008 CEI)
TRD-13-0060-2 (CISPR-25:2008 CEV)
TRD-13-0060-2 (CISPR-25:2008 RE)
TRD-13-0060-2 (ESD SAE 1113-13) 8KV contact 15KV air discharge
TRD-13-0060-2 (SAE 1113-11 Voltage Transients) Pulses #1, #2a, #2b, #3a, #3b, #4, #5a
TRD-13-0064-3 (CISPR-25 CEI)
TRD-13-0064-3 (CISPR-25 CEV)
TRD-13-0064-3 (CISPR-25 RE)
TRD-13-0064-3 (ESD SAE J1113-13)
TRD-13-0064-3 (SAE 1113-11 Supply Voltage Transients @ +23șC) Pulses #1, #2a, #2b, #3a, #3b, #4, #5a
TSC7001G_5_2_Field_Decay_Test
TSC7001G_5_5_3_Load Dump Test 1
TSC7001G_5_5_4_Load Dump Test 2
TSC7001G_5_5_5_Load Dump Test 3
TSC7026G_3_4_Narrow Band Emissions
Validation of methods
Validation of methods - determination of test method performance
Validation of methods - objective evidence
Validation of methods - range and accuracy per customer needs
ACCREDITATION A2LA/2006
TEST TITLE LIMITATIONS
DC-10614_B_10.1 ESD Handling Test
DC-10614_B_10.2 ESD Operating Tests
DC-10614_B_6.3 CISPR-25 Conducted RF Emissions - Voltage on Supply Lines (Motors)
DC-10614_B_6.7 Conducted Transient Emissions
DC-10614_B_7.3_LP-388C-72_A Bulk Current Injection (BCI) Test
DC-10614_B_7.5_LP-388C-35_A_ALSE without a Ground Plane
DC-10614_B_7.6_LP-388C-34_A TEM Cell Test
DC-10614_B_8.0_LP-388C-58_A Magnetic Field Immunity
DC-10614_B_9.1_LP-388C-39_A Transient Disturbances Conducted along Supply Lines
DC-10614_B_9.2_LP-388C-39_A Transient Disturbances Conducted along I/O or Sensor Lines
DC-10615_B_10.1_Operating and voltage Stress
DC-10615_B_8.3_Load Dump
ACCREDITATION Chrysler Supp.
TEST TITLE LIMITATIONS
CS-11979: 2010 (5.3) CISPR-25 Radiated Emissions
CS-11979:2010 - DUT Configuration and Verification per EMC Test Plan
CS-11979:2010 - DUT Parameteric Test per EMC test plan or customer specification
CS-11979:2010 - EMC Test Plan Development
CS-11979:2010 - EMC Test Report Development
CS-11979:2010 - Load Simulator Configuration
CS-11979:2010 - SITE SELF-ASSESSMENT REPORT FOR OEM RECOGNITION OF VALIDATION REPORTS
CS-11979:2010 (4.1.1) Supply Voltage Range
CS-11979:2010 (4.1.2) Ignition Off Draw (IOD)
CS-11979:2010 (4.1.3) Supply Voltage Ripple (Superimposed Alternating Voltage)
CS-11979:2010 (4.2.1) Sneak Path
CS-11979:2010 (4.2.2) Supply Voltage Drop Out
CS-11979:2010 (4.2.3) Power Supply disconnection
CS-11979:2010 (4.2.4) Reset Behavior at Voltage Drop
CS-11979:2010 (4.2.5) Supply Voltage Dips
CS-11979:2010 (4.2.6) Engine Cranking Low Voltage – Resembling Cold Cranking
CS-11979:2010 (4.2.7) Engine Cranking Low Voltage – Warm cranking / Stop – Start
CS-11979:2010 (4.2.8) Slow Increase and Decrease of Supply Voltage
CS-11979:2010 (4.3.1) Defective Regulation (Full-Fielded Alternator) and Jump Start
CS-11979:2010 (4.3.2) Reverse Supply Voltage
CS-11979:2010 (4.4.1) Immunity to Short Circuits in the Supply Voltage Input and Load Output Lines
CS-11979:2010 (4.4.2) Immunity to Short Circuits in I/O Signal Lines
CS-11979:2010 (4.4.3) Immunity to Potential Differences Between Supplies
CS-11979:2010 (4.4.4) Motor Stall
CS-11979:2010 (4.4.5) Insulation Resistance
CS-11979:2010 (5.1) CISPR-25 Conducted RF Emissions - (Voltage on Supply Lines)
CS-11979:2010 (5.2) CISPR-25 Conducted RF Emissions - (Current on all Lines in Harness)
CS-11979:2010 (5.3) CISPR-25 Radiated Emissions
CS-11979:2010 (5.4) Conducted Transient Emissions
CS-11979:2010 (6.1) Bulk Current Injection (BCI) Test
CS-11979:2010 (6.2) Absorber Lined Shielded Enclosure (ALSE) with or without a Ground Plane
CS-11979:2010 (6.3) Magnetic Field Immunity
CS-11979:2010 (6.4.3) Transient Immunity of I/O or Sensor Lines – Direct Capacitive Coupling
CS-11979:2010 (6.4.4) Transient Immunity of LED Lighting Power Lines
CS-11979:2010 (7.0; 7.1; 7.1.1) ELECTROSTATIC DISCHARGE (ESD) Handling
CS-11979:2010 (7.2; 7.2.2; 7.2.3) ESD, Operating Test (Direct Coupled; Field Coupled)
ACCREDITATION Chrysler Supplier Lab
TEST TITLE LIMITATIONS
DC-10614_B_6.2 PIN CONDUCTED RF EMISSIONS (PCE) - 0.15 to 200 MHz
DC-10614_B_6.3_LP-388C-73_A CISPR-25 Conducted RF Emissions - Voltage on Supply Lines
DC-10614_B_6.5_LP-388C-73_A Radiated Emissions (76 TO 1000 MHz CISPR-25 ALSE method)
DC-10614_B_6.6_LP-388C-71_A Magnetic Field Emissions
DC-10615_B_10.2_Stall
DC-10615_B_6.1_Supply Voltage Range
DC-10615_B_6.2_IGNITION OFF CURRENT DRAW (IOD)
DC-10615_B_6.3_Supply Voltage Ripple
DC-10615_B_7.1_Supply Switch Deactivation
DC-10615_B_7.2_Supply Voltage Drop Out
DC-10615_B_7.3_Supply Voltage Dips
DC-10615_B_7.4_Engine Cranking Low Voltage
DC-10615_B_7.5_Supply Voltage Ramp Up
DC-10615_B_7.6_Supply Voltage Ramp Down
DC-10615_B_8.1_Defective Regulation (Full Field Alternator)
DC-10615_B_8.2_Jump Start
DC-10615_B_8.4_Reverse Supply Voltage
DC-10615_B_9.1_Immunity to Short Circuits in the Supply Voltage I/O Lines
DC-10615_B_9.2_Immunity to Short Circuits in I/O Signal Lines
DC-10615_B_9.3_Resistance to Overload
DC-10615_B_9.4_Supply Voltage Offset
DC-10615_B_9.5_Ground Reference Offset
DC-10615_D_10.1_Operating and Voltage Stress
DC-10615_D_10.2_Stall
DC-10615_D_6.1_Supply Voltage Range
ACCREDITATION N/A
TEST TITLE LIMITATIONS
28401NDS02[7] - EQ/IC 01 Resistance to pulses 1 and 1 bis and 2a (ISO 7637-2)
28401NDS02[7] - EQ/IC 02 Resistance to pulses 3a and 3b (ISO 7637-2), [1kHz to 100kHz]
28401NDS02[7] - EQ/IC 03 Resistance to pulse 5b (ISO 7637-2:2004 / ISO 16750-2:2012) Clamped Load Dump (21.5V, 400 ms)
28401NDS02[7] - EQ/IC 04 Resistance to power supply micro-interruptions (ISO 16750-2) 10ìs, 100ìs, 5ms, 50ms, 300ms
28401NDS02[7] - EQ/IC 05 Resistance to starting profile (ISO 16750-2), (S&S, I, II, III)
28401NDS02[7] - EQ/IC 06 Resistance to on-board power system voltage ripples (ISO 16750-2), [50 Hz – 50 kHz]
28401NDS02[7] - EQ/IC 07 Immunity to signal line transients (ISO 7637-3), P3a (-150V) & P3b (+100V)
28401NDS02[7] - EQ/IC 08 Immunity to bulk current injection (BCI) (ISO 11452-4), [1 MHz - 400 MHz], Closed Loop Method
28401NDS02[7] - EQ/IC 09 Immunity to ignition high voltage, [±10kV on 15kohm]
28401NDS02[7] - EQ/IC 10 Resistance of inductive load connected circuits, P1b (+/- 100V)
28401NDS02[7] - EQ/IC 11 Resistance to impulsive transient (via coupling capacitor 10nF/470pF)
28401NDS02[7] - EQ/IR 01 Immunity to radiated field (semi-anechoic or anechoic chamber) (ISO 11452-2), [200MHz - 2,5GHz] & [2,7GHz - 3,2GHz], 200 V/m
28401NDS02[7] - EQ/IR 02 Immunity to audio frequency magnetic field (ISO 11452-8), [DC and 15Hz - 200kHz]
28401NDS02[7] - EQ/IR 03 Resistance to electrostatic discharges, equipment not supplied (ISO 10605)
28401NDS02[7] - EQ/IR 04 bis Resistance to electrostatic discharges, equipment with peripherals mounted on the external vehicle surface in Key-OFF mode (ISO 10605)
28401NDS02[7] - EQ/IR 04 Resistance to electrostatic discharges, equipment supplied (ISO 10605)
28401NDS02[7] - EQ/IR 05 Resistance to handy transmitters (ISO 11452-9), [28 MHz to 2.7 GHz], contact & 50 mm antenna distance
28401NDS02[7] - EQ/MC 01 Measurement of conducted transient emission (ISO 7637-2)
28401NDS02[7] - EQ/MC 02 Measurement of conducted current emission, [20Hz - 5,9MHz]
28401NDS02[7] - EQ/MC 03 Measurement of radio frequency conducted emission (CISPR 25), [100kHz to 108MHz], additional RF Voltage Probe Measurements
28401NDS02[7] - EQ/MR 01 Measurement of radio frequency radiated emission (CISPR 25), [100kHz - 2GHz]
28401NDS02[7] - EQ/MR 02 Measurement of magnetic field radiated emissions (MIL-STD 461 E), [20 Hz to 200 KHz]
28401NDS02[7] - EQ/TE 01 Resistance to power supply voltages (ISO 16750-2), [6V, 8V, 9V, 10.5V & 16V]
28401NDS02[7] - EQ/TE 02 Resistance to slow decrease and increase power of supply voltages (ISO 16750-2)
28401NDS02[7] - EQ/TE 03 Re-initialization test (ISO 16750-2), (drop by 5% from 14V to 0V)
28401NDS02[7] - EQ/TE 04 Resistance to non usual power supply voltages (ISO 16750-2), alternator regulator, over-voltage, jump-start, reversed voltage
28401NDS02[7] - EQ/TE 05 Resistance to ground and positive supply voltages short circuit (ISO16750-2)
A2LA ALSE Chamber Door Maintenance
A2LA ALSE Chamber NSA Report
A2LA ALSE Chamber Shielding Efectiveness Report
A2LA BCI Chamber Door Maintenance
A2LA BCI Chamber Shielding Efectiveness Report
A2LA Documentation Maintenance
A2LA Performance Testing
A2LA Test Method Trends Testing
Capacitive coupling clamp, Pulse 3a & Pulse 3b (I/O lines) ISO 7637-3 (2007)
CS.00054 (05.05.07) Immunity to leakage resistance
CS.00054 (05.02.01) Supply Voltage Range [-40°C, 23°C and Tmax]
CS.00054 (05.02.02) Ignition Off Draw (IOD) [RT & 65ș C]
CS.00054 (05.02.03) Supply Voltage Ripple (Superimposed Alternating Voltage) ISO 16750-2
CS.00054 (05.03.01) Supply Voltage Variations - Sneak Path
CS.00054 (05.03.02) Supply Voltage Variations - Supply Voltage Drop Out
CS.00054 (05.03.03) Supply Voltage Variations - Power Supply disconnection, ISO 16750-2 single & multiple line interruptions
CS.00054 (05.03.04) Supply Voltage Variations - Reset Behavior at Voltage Drop, ISO 16750-2
CS.00054 (05.03.05) Supply Voltage Variations - Supply Voltage Dips
CS.00054 (05.03.06) Supply Voltage Variation - Engine Cranking Low Voltage – Resembling Cold Cranking
CS.00054 (05.03.07) Supply Voltage Variation - Engine Cranking Low Voltage – Warm cranking / Stop – Start
CS.00054 (05.03.08) Supply Voltage Variation - Slow Increase and Decrease of Supply Voltage, ISO 16750-2
CS.00054 (05.04.01) Defective Regulation (Full-Fielded Alternator) and Jump Start
CS.00054 (05.04.02) Reverse Supply Voltage, ISO 16750-2
CS.00054 (05.05.01 Immunity to Short Circuits in the Supply Voltage Input and Load Output Lines
CS.00054 (05.05.02) Immunity to Short Circuits in I/O Signal Lines
CS.00054 (05.05.03) Immunity to Potential Differences Between Supplies
CS.00054 (05.05.04) Motor Stall
CS.00054 (05.05.05) Insulation Resistance (ISO 16750-2, 4.12)
CS.00054 (05.05.06) Breakdown Voltage (ISO 16750-2, 4.11)
CS.00054 (05.05.08) Immunity to high series resistance
CS.00054 (05.06.01) CISPR-25 Conducted RF Emissions - (Voltage on Supply Lines)
CS.00054 (05.06.02) CISPR-25 Conducted RF Emissions - (Current on all Lines in Harness)
CS.00054 (05.06.03) CISPR-25 Radiated Emissions
CS.00054 (05.07.01) Conducted Transient Emissions (ISO 7637-2)
CS.00054 (05.08.01) Radiated Immunity: BCI (ISO 11452-4, 1 - 400 MHz)
CS.00054 (05.08.02) Radiated Immunity: ALSE (ISO 11452-2, 200 – 3,200 MHz)
CS.00054 (05.08.03) Magnetic Field Immunity ISO 11452-8 (15 Hz to 150 kHz)
CS.00054 (05.09.01) Transient Immunity of Supply Lines (ISO 7637-2 & ISO 16750-2)
CS.00054 (05.09.02) Transient Immunity of I/O or Sensor Lines – Coupling Clamp (CCC) ISO 7637-3
CS.00054 (05.09.03) Transient Immunity of I/O or Sensor Lines - Direct Capacitive Coupling (DCC) ISO 7637-3
CS.00054 (05.09.04) Transient Immunity of LED Lighting Power Lines (ISO 7637-3)
CS.00054 (05.10.01) ESD Handling (ISO 10605), 150 pF and 330 ohms, ±3 kV, ±4 kV, ±8 kV
CS.00054 (05.10.02.02) ESD Operational Direct Coupled, 330 pF, 330 ohm, ± 8 kV, ± 15 kV
CS.00054 (05.10.02.03) ESD Operational Field Coupled, 330 pF, 330 ohm, ±15 kV, ±20 kV
CS.00054 (05.10.02.04) ESD Remote Inputs and Communication Lines, 150 pF, 2000 ohm, ±4 kV, ±8 kV
CS.00054 DUT Activation & Monitoring Configuration
CS.00054 DUT CAN Bus Scheduler
CS.00054 EMC Load Simulator Development
CS.00054 EMC Test Plan Development
CS.00054 EMC Test Report Development
CS-11979:2010 - EMC Test Load Simulator Design and Build
CS-11979:2010 - Equipment Quotation
CS-11979:2010 - Equipment Verification
CS-11979:2010 - Test Quotation
DC-10614_B_6.3_LP-388C-73_A CISPR-25 Conducted RF Emissions - Voltage on Supply Lines
DC-10614_B_6.4_LP-388C-73_A CISPR 25 Conducted RF Emissions - Current on all Lines in Harness
DC-10614_B_6.4_LP-388C-73_A CISPR 25 Conducted RF Emissions - Current on all Lines in Harness
DUT Communication Bus Configuration (HW/SW)
DUT HW/SW Configuration
DUT Performance / Functional Verification prior to test
DUT Test Harness & Mate Connectors Build
EMC Design Consulting
EMC Load Simulator Build
EMC Load Simulator Support
EMC Test Consulting
EMC Test External Quotation
EMC Test Internal Quotation
EMC Test Outsourcing Quotation
EMC Test Outsourcing Support
EMC Test Plan Development & OEM Approval
EMC Test Report (Summary and Full)
EMC-CS-2009.1 (10.0) CE 410 (Conducted Transient Emissions)
EMC-CS-2009.1 (11.4) RI 112 (BCI) 1 to 400 MHz CBCI/DBCI (ISO-11452-4 substitution method)
EMC-CS-2009.1 (11.5) RI 114 (400 MHz to 3.2 GHz) ALSE Method (ISO 11452-2 substitution method)
EMC-CS-2009.1 (11.6) RI 115 (RF Immunity to hand portable transmitters)
EMC-CS-2009.1 (12.0) RI 140 (magnetic Field Immunity)
EMC-CS-2009.1 (13.0) RI 130 (Coupled Immunity)
EMC-CS-2009.1 (14.0) RI 150 (Coupled Immunity)
EMC-CS-2009.1 (15.0) CI 210 (Immunity from Continuous Power Line Disturbances)
EMC-CS-2009.1 (16.0) CI 220 (Immunity from Transient Disturbances)
EMC-CS-2009.1 (17.0) CI 230 (Immunity from Power Cycling)
EMC-CS-2009.1 (18.0) CI 250 (Immunity to Ground Voltage Offset)
EMC-CS-2009.1 (19.0) CI 260 (Immunity to Voltage Dropout)
EMC-CS-2009.1 (20.0) CI 270 (Immunity to Voltage Overstress)
EMC-CS-2009.1 (21.0) CI 280 (Electrostatic Discharge)
EMC-CS-2009.1 (5.2) Flex Test Plan Development
EMC-CS-2009.1 (5.7) Test Report Development
EMC-CS-2009.1 (7.0) RE 310 (Radiated RF Emissions)
EMC-CS-2009.1 (8.0) CE 420 (Conducted RF Emissions)
EMC-CS-2009.1 (9.0) CE 421 (Conducted Emissions)
EMC-CS-2009.1 (Annex G) Load Simulator (Flex Development)
EMC-CS-2009.1 Flex DUT configuration
EMC-CS-2009.1 Flex Quotation for External Customers
EMSCAN Tablet SM-1700 (10 to 1700 MHz) Spatial Scan
EMSCAN Tablet SM-1700 (10 to 1700 MHz) Spectral Scan
EMSCAN Tablet SM-LF-100 (1 to 1700 MHz) Spatial Scan
EMSCAN Tablet SM-LF-100 (1 to 1700 MHz) Spectral Scan
ENG-SPEC-0183:2012 (3.3.11.2) Operating Voltage
ENG-SPEC-0183:2012 (3.3.11.3) Over Voltage
ENG-SPEC-0183:2012 (3.3.11.4) Reverse Polarity
ENG-SPEC-0183:2012 (3.3.11.5) Short-circuit Protection
ENG-SPEC-0183:2012 (3.3.11.7) Starting Voltage
ENG-SPEC-0183:2012 (3.3.12.2) Load Dump (Open Battery)
ENG-SPEC-0183:2012 (3.3.12.3) Inductive Load Switching
ENG-SPEC-0183:2012 (3.3.12.4) Alternator Field Decay (Alternator Vehicles Only)
ENG-SPEC-0183:2012 (3.3.13.1) Electrical Noise Characteristics
ENG-SPEC-0183:2012 (3.3.13.2) Accessory Noise
ENG-SPEC-0183:2012 (3.3.14.2) ESD Powered-up Test Procedure (SAE J1113-13)
ENG-SPEC-0183:2012 (3.3.14.3) ESD Handling Test Procedure (SAE J1113-13)
ENG-SPEC-0183:2012 (3.3.15.2) Anechoic Chamber Test Method (SAE J1113-21)
ENG-SPEC-0183:2012 (3.3.15.3) Strip Line Test Method (SAE J1113-23)
ENG-SPEC-0183:2012 (3.3.15.4) Bulk Current Injection (BCI) 1 to 400 MHz (SAE J1113-4)
ENG-SPEC-0183:2012 (3.3.15.5) TEM Cell 1MHz to 1GHz (SAE J1113-24)
ENG-SPEC-0183:2012 (3.3.15.6) Magnetic Field Test Method with Helmholtz Coils (Power Line Simulation) (SAE J1113-22)
ENG-SPEC-0183:2012 (3.3.16.2) Component Conducted Emissions (SAE J1113-41)
ENG-SPEC-0183:2012 (3.3.16.2) Component Radiated Emissions (SAE J1113-41)
ENG-SPEC-0183:2012 (3.3.17.1) AC Power Line Electric Field Susceptibility (SAE J1113-26)
ENG-SPEC-0183:2012 (3.3.18.1) AC Power Line Magnetic Field Susceptibility (SAE J1113-22)
GM9116P:1996 Immunity to Conducted Sinusoidal Bursts (0.5 - 50 MHz) - 5uH / 50uH LISN
GMW3097:2012 (3.3.1) RE, Absorber Lined Shielded Enclosure (ALSE) 0.53 - 1583 MHz [CISPR-25]
GMW3097:2012 (3.3.2) CE, Artificial Network (AN) 0.53 to 1.71 MHz [CISPR-25]
GMW3097:2012 (3.3.3) Magnetic Fields (PEPS LF) 100 KHz to 150 KHz
GMW3097:2012 (3.4.1) RI, Bulk Current Injection (BCI) 1 MHz to 400 MHz [ISO 11452-4 ]
GMW3097:2012 (3.4.2) RI, Anechoic Chamber 400 MH to 2 GHz [ISO 11452-2]
GMW3097:2012 (3.4.4) Immunity to Power Line Magnetic Fields Helmholtz coil method [ISO 11452-8]
GMW3097:2012 (3.5.1) CE, Transients [ISO 7637-2]
GMW3097:2012 (3.5.2) CI, Transients on Power Lines (Pulses 1, 2a, 2b, 3a, 3b, 4, 5b, 7) (CCC) [ISO 7637-2]
GMW3097:2012 (3.5.3) CI, Coupling to I/O other than power supply lines (Pulse 3a, 3b) [ISO 7637-3]
GMW3097:2012 (3.5.4) CI, Direct Capacitor Coupling to Sensor Lines (Pulse 2a DCC 30V) [ISO 7637-2&3]
GMW3097:2012 (3.5.5) CI, 85V Direct Capacitor Coupling to Sensor Lines (Pulse 2a DCC 85V) [ISO 7637-2&3]
GMW3097:2012 (3.5.6) CI, Alternator Direct Capacitor Coupling (Pulse 3a/3b DCC 200V)
GMW3097:2012 (3.6.3) ESD, Test during Operation of the Device (Power-On Mode) [ISO 10605:2001]
GMW3097:2012 (3.6.4) ESD, Remote Inputs/ Outputs
GMW3097:2012 (3.6.5) ESD, Handling of Devices [ISO 10605:2001]
GMW3097:2012 (3.7.2) DC Brush-Commutated Motors - Capacitance and Diode Transient Voltage Clamp Requirement
GMW3097:2012 (3.7.3) Package Protection Short-Duration Motor Inductors
GMW3097:2012 (3.7.4) Package Protection - Short-Duration BM Motor Transient Voltage Suppression
GMW3097:2012 (3.7.5) Static Charge Bleed-Off Resistor Present (DUT with DC-Isolated Metallic Cases)
GMW3097:2012 (3.7.6) Package-Protection NTC/PTC Shunt Capacitor.
GMW3172:2008 (9.2.16) Isolation Resistance.
GMW3172:2010 (8.2.1) Jump Start
GMW3172:2010 (8.2.2) Reverse Polarity
GMW3172:2010 (8.2.3) Over Voltage
GMW3172:2010 (8.2.4) State Change Waveform Characterization
GMW3172:2010 (8.2.5) Ground Path Inductance Sensitivity
GMW3172:2010 (9.2.1) Parasitic Current
GMW3172:2010 (9.2.10) Open Circuit – Multiple Line Interruption
GMW3172:2010 (9.2.11) Ground Offset
GMW3172:2010 (9.2.12) Power Offset
GMW3172:2010 (9.2.13) Discrete Digital Input Threshold Voltage
GMW3172:2010 (9.2.14) Over Load – All Circuits
GMW3172:2010 (9.2.15) Over Load – Fuse Protected Circuits
GMW3172:2010 (9.2.16) Isolation Resistance
GMW3172:2010 (9.2.17) Crank Pulse Capability and Durability
GMW3172:2010 (9.2.2) Power Supply Interruptions
GMW3172:2010 (9.2.3) Battery Voltage Dropout
GMW3172:2010 (9.2.4) Sinusoidal Superimposed Voltage
GMW3172:2010 (9.2.5) Pulse Superimposed Voltage
GMW3172:2010 (9.2.6) Intermittent Short Circuit to Battery and to Ground
GMW3172:2010 (9.2.7) Continuous Short Circuit to Battery and to Ground
GMW3172:2010 (9.2.8) Ground Interconnect Short to Battery
GMW3172:2010 (9.2.9) Open Circuit – Single Line Interruption
GMW3172:2010 Test Report
ISO 11452-2 Anechoic chamber, 200 to 3000 MHz
ISO 11452-3 TEM cell, 1 to 400 MHz
ISO 11452-4 BCI, 0.1 to 400 MHz
Laboratory Database Maintenance
Laboratory Equipment Maintenance
Laboratory Equipment Verification
Laboratory Management System
Laboratory Procedure Maintenance
Laboratory Specifications Maintenance
Laboratory Work Instructions
Load Simulator/ Monitoring Equipment Configuration
MBN 10284-2:2011 (10) Slew rates of pulsed signals (SR-Test) V & I measurements
MBN 10284-2:2011 DUT Configuration
MBN 10284-2:2011 EMC Load Simulator Design & Build
MBN 10284-2:2011 EMC Test Plan Development & Approval
MBN 10284-2:2011 EMC Test Quotation
MBN 10284-2:2011 EMC Test Report Release
MBN LV124-1:2013 (6.01) E-01 Long-term overvoltage
MBN LV124-1:2013 (6.02) E-02 Transient overvoltage
MBN LV124-1:2013 (6.03) E-03 Transient undervoltage
MBN LV124-1:2013 (6.04) E-04 Jump Start
MBN LV124-1:2013 (6.07) E-07 Slow decrease and increase of the supply voltage
MBN LV124-1:2013 (6.08) E-08 Slow decrease, abrupt increase of the supply voltage
MBN LV124-1:2013 (6.09) E-09 Reset Behavior
MBN LV124-1:2013 (6.10) E-10 Short interruptions
MBN LV124-1:2013 (6.11) E-11 Start pulses
MBN LV124-1:2013 (6.12) E-12 Voltage profile for on-board electrical system control
MBN LV124-1:2013 (6.13) E-13 Pin interruption
MBN LV124-1:2013 (6.14) E-14 Connector interruption
MBN LV124-1:2013 (6.15) E-15 Reverse polarity
MBN LV124-1:2013 (6.16) E-16 Ground offset
MBN LV124-1:2013 (6.17) E-17 Short circuit in signal circuit and load circuits
MBN LV124-1:2013 (6.18) E-18 Insulation resistance
MBN LV124-1:2013 (6.19) E-19 Closed-circuit current
MBN LV124-1:2013 (6.20) E-20 Dielectric strength
MBN LV124-1:2013 (6.21) E-21 Backfeeds
MBN LV124-1:2013 (6.22) E-22 Overcurrents
MBN LV124-2:2013 DUT Configuration
MBN LV124-2:2013 Electrical Load Simulator Design & Build
MBN LV124-2:2013 Electrical Test Plan Development & Approval
MBN LV124-2:2013 Electrical Test Quotation
MBN LV124-2:2013 Electrical Test Report Release
Pulse 1 (ISO 7637-2)
Pulse 2 (ISO 7637-2)
Pulse 6 (ISO 7637-2)
Pulse group 3a + 3b
SAE J1455 Conducted Immunity (Load Dump, Inductive Sw, Mutual) Table 4a / 4b
SAE J1455 Conducted Immunity (Voltage Regulation Characteristics) Table 3a / 3b
SAE-J1113-02 Conducted Immunity (Supply Voltage Ripple) 30 Hz to 250 KHz, Appendix B, Table B1
SAE-J1113-02:2004 Conducted Immunity, 15 Hz to 250 kHz-All Leads
SAE-J1113-03:2006 Conducted Immunity, 250 kHz to 400 MHz, Direct Injection of Radio Frequency (RF) Power
SAE-J1113-11:2007 Immunity to Conducted Transients on Power Leads (Pulses 1a, 1b, 1c, 2a, 2b, 3a, 3b, 4, 5a, 5b)
SAE-J1113-12:2006 (1.1.1) Capacitive Coupling Clamp (CCC)
SAE-J1113-12:2006 (1.1.3) Direct Capacitor Coupling (DCC)
SAE-J1113-13:2004 ESD (5) ESD for Packaging and Handling (Non-Powered Mode Test)
SAE-J1113-21 Radiated Immunity_ALSE 10 KHz to 18 GHz
SAE-J1113-21:2005 RI ALSE without a Ground Plane
SAE-J1113-41:2000 Conducted Emissions Component/Module
SAE-J1455:2006 (4.13.1) Steady State Electrical Characteristics - Cold Cranking
SAE-J1455:2006 (4.13.1) Steady State Electrical Characteristics - Normal Operating Vehicle
SAE-J1455:2006 (4.13.1) Steady State Electrical Characteristics - Reverse Polarity
SAE-J1455:2006 (4.13.1) Steady State Electrical Characteristics - Voltage Regulator Failure
Test Results Customer Support
TL-82466:2002 (7.1) ESD Packaging ISO 10605
TL-82466:2002 (7.1) ESD Powered ISO 10605
TL-82466:2002 (7.1) ESD System (laboratory setup) ISO 10605
TL-82566:2006 (6.1.2) MFI Helmholtz Coil, 15 Hz to 30 kHz, MIL-STD-461E
TL-965:2006 (5.2.1) Conducted transient emissions in the artificial network - DUT with long ground return line (distant connection) CISPR 25, Edition 3.0 150 kHz to 108 MHz (PK,AVG, QP detectors)
TL-965:2006 (5.2.2) Conducted transient emissions in the artificial network - DUT with short ground return line (local connection) CISPR 25, Edition 3.0 150 kHz to 108 MHz (PK, AVG, QP detectors)
TL-965:2006 (5.2.3) Conducted transient emissions in the artificial network - measuring setup for generators CISPR 25, Edition 3.0 150 kHz to 108 MHz (PK,AVG, QP detectors)
TL-965:2006 (5.2.4) Measurement of radiated interferences in the anechoic chamber, CISPR 25, Edition 3.0 - Section 6.4, 150 KHz to 2.5 GHz, (PK, AVG, QP detectors), 2 antenna polarizations, 2 DUT orientations
TL-965:2006 (5.2.5) Conducted transient emissions - measured in the TEM cell, CISPR 25, 2nd edition (2002-08), Section 6.2.3 150 KHz to 108 MHz, BB - PK & QP detector, NB - PK detector
TL-965:2006 (5.2.5) Measuring setup for interference voltage measurement on pencil coils, CISPR 12, 5th edition, Appendixes E and F
TL-965:2006 (5.2.6) Measurement of radiated interferences in the TEM cell, CISPR 25, Edition 3.0 - Section 6.5, 150 KHz to 200 /400 MHz, (PK, AVG, QP detectors) 2 DUT orientations
TL-965:2006 (Appendix A) Measurement of transients radiated by components - Stripline method - (150 kHz to 400 MHz), CISPR 25, Edition 3.0 - Section 6.5
TRD-13-0047 Rev-8 OPERATING VOLTAGE (12.0) Supply Voltage Variation
TRD-13-0060-2 (CAN Bus HW/SW Configuration)
TRD-13-0060-2 (DUT Integrity Verification)
TRD-13-0060-2 (ISO 17025 Compliant Test Report)
TRD-13-0060-2 (Negative supply voltage)
TRD-13-0060-2 (Operating Voltage Range)
TRD-13-0060-2 (Short circuit @ 23°C)
TRD-13-0060-2 (Supply Voltage Drop -40°C, +23°C, 85°C)
TRD-13-0060-2 (Supply Voltage Variation @ -40°C, +23°C, 85°C)
TRD-13-0060-2 (Test Plan Development)
TRD-13-0064-3 (CAN Bus HW/SW Configuration)
TRD-13-0064-3 (Current Consumption)
TRD-13-0064-3 (DUT Integrity Verification)
TRD-13-0064-3 (ISO-17025 Compliant Test Report)
TRD-13-0064-3 (Load Simulator / Monitoring Equipment Configuration)
TRD-13-0064-3 (Operating Voltage Range)
TRD-13-0064-3 (Reverse Supply Volatge)
TRD-13-0064-3 (Short Circuit to GND and VBATT)
TRD-13-0064-3 (Supply Voltage Variation)
TRD-13-0064-3 (Test Plan Development)
TRD-13-0064-3 (Voltage Dropout) - imported from TRD-13-0060-2
VW EMC & Electrical DUT Load Simulator and CAN bus HW/SW Config
VW EMC & Electrical DUT Load Simulator Design & Build
VW EMC & Electrical DUT Operating Modes Configuration per EMC Test Plan
VW EMC & Electrical DUT Parametric Test per EMC Test Plan
VW EMC & Electrical Test Plan Development & Approval
VW EMC & Electrical Test Report Development & Release
VW-80000: 2013 (6.1) E-01 Long-term overvoltage
VW-80000: 2013 (6.10) E-10 Short interruptions
VW-80000: 2013 (6.11) E-11 Start pulses
VW-80000: 2013 (6.12) E-12 Voltage curve with electric system control
VW-80000: 2013 (6.13) E-13 Pin interruption
VW-80000: 2013 (6.14) E-14 Connector interruption
VW-80000: 2013 (6.15) E-15 Reverse polarity
VW-80000: 2013 (6.2) E-02 Transient overvoltage
VW-80000: 2013 (6.3) E-03 Transient undervoltage
VW-80000: 2013 (6.4) E-04 jump start
VW-80000: 2013 (6.5) E-05 Load dump
VW-80000: 2013 (6.6) E-06 Superimposed alternating voltage
VW-80000: 2013 (6.7) E-07 Slow decrease and increase of the supply voltage
VW-80000: 2013 (6.8) E-08 Slow decrease, quick increase of the supply voltage
VW-80000: 2013 (6.9) E-09 Reset behavior
VW-80101:2006 (3.02) Operating voltage dips
VW-80101:2006 (3.04) Operating current
VW-80101:2006 (3.06) Function during undervoltage and overvoltage
VW-80101:2006 (3.07) Closed-circuit current consumption
VW-80101:2006 (3.08) Reverse-polarity protection
VW-80101:2006 (3.09) Overcurrent resistance
VW-80101:2006 (3.10) Overvoltage protection during long-term operation
VW-80101:2006 (3.11) Overvoltage protection during short-term operation
VW-80101:2006 (3.12) Superimposed alternating voltage
VW-80101:2006 (3.13) Slow lowering and increasing of the supply voltage
VW-80101:2006 (3.14) Reset behavior at voltage dip
VW-80101:2006 (3.15) Short-circuit protection
VW-80101:2006 (3.16) Breakdown strength
VW-80101:2006 (3.17) Insulation resistance
VW-80101:2006 (3.18) Interruptions (pin and plug)
VW-80101:2006 (3.19) Voltage drops
LAB ID TRIALON (EMC)
ACCREDITATION A2LA
TEST TITLE LIMITATIONS
EMC-CS-2009.1 (10.0) CE 410 (Conducted Transient Emissions)
EMC-CS-2009.1 (11.4) RI 112 (BCI) 1 to 400 MHz CBCI/DBCI (ISO-11452-4 substitution method)
EMC-CS-2009.1 (11.5) RI 114 (400 MHz to 3.2 GHz) ALSE Method (ISO 11452-2 substitution method)
EMC-CS-2009.1 (11.6) RI 115 (RF Immunity to hand portable transmitters)
EMC-CS-2009.1 (12.0) RI 140 (magnetic Field Immunity)
EMC-CS-2009.1 (13.0) RI 130 (Coupled Immunity)
EMC-CS-2009.1 (14.0) RI 150 (Coupled Immunity)
EMC-CS-2009.1 (15.0) CI 210 (Immunity from Continuous Power Line Disturbances)
EMC-CS-2009.1 (16.0) CI 220 (Immunity from Transient Disturbances)
EMC-CS-2009.1 (17.0) CI 230 (Immunity from Power Cycling)
EMC-CS-2009.1 (18.0) CI 250 (Immunity to Ground Voltage Offset)
EMC-CS-2009.1 (19.0) CI 260 (Immunity to Voltage Dropout)
EMC-CS-2009.1 (20.0) CI 270 (Immunity to Voltage Overstress)
EMC-CS-2009.1 (21.0) CI 280 (Electrostatic Discharge)
EMC-CS-2009.1 (5.2) Flex Test Plan Development
EMC-CS-2009.1 (5.7) Test Report Development
EMC-CS-2009.1 (5.7) Test Report Review & Analysis
EMC-CS-2009.1 (7.0) RE 310 (Radiated RF Emissions)
EMC-CS-2009.1 (8.0) CE 420 (Conducted RF Emissions)
EMC-CS-2009.1 (9.0) CE 421 (Conducted Emissions)
EMC-CS-2009.1 (Annex G) Load Simulator (Flex Development)
EMC-CS-2009.1 Flex DUT configuration
EMC-CS-2009.1 Flex Project Outsourcing Test Quotation
 
Grand Total (635 Detail Records)
 

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