EMC FLEX BLOG A site dedicated to Automotive EMC Testing for Electronic Modules

DUT I/O activation and monitoring during EMC validations

The main goal is to EMC validate DUT's hardware design assuming that DUT's software was developed to

The goal is to EMC validate DUT's Hardware Design assuming that DUT's Software was developed to serve the DUT's Hardware. Following a successful EMC validation, the DUT software may be subject to multipe updates and upgrades to serve the original hardware design w/o altering the outcome of overall product EMC validation.

DUT's software is used to exercise and monitor I/O lines and functions. The use of DUT production software should not be mandatory since may not be finalized prior to validation. The use of specialized DUT software is recommended since the production software may not be efficient enough to otimize the EMC testing time. The use of specialized DUT software is allowed provided that:

1) SW diagnostic timers are set to minimum detection values such that during the maximum 2-second RF exposure time all DUT response error flags are being captured and reported. Using production intent software would extend the DUT activation dwell time beyond 10 seconds such that long duation functions and/or sequential activation of various functions becomes possible.

2) DUT's state and fault conditions are reported directly via communication bus or indirectly via cyclying the outputs (e.g. changes to PWM duty cycle, monitoring LED flash rate, inadvertent status change).

3) DUT monitored data, I/O status values, analog input voltages, operating state are queried via parameter requests to ensure bi-directional communication during RF Immunity. Monitoring functional status via DUT scheduled or periodic broadcast messges is not recommended.

Module to Vehicle Interface Connector and User Interface I/O

Analog Inputs are set nominally to mid-range values and reported:
  • directly via communication bus
  • indirectly via cyclying the outputs (e.g. changes to PWM duty cycle, monitoring LED flash rate, inadvertent status change) 
Analog Outputs are set nominally to mid-range values and reported:
  • directly via Fiber Optic system
  • indirectly via loop back method (e.g. monitoring the simulated load using a DUT input)
Digital Inputs are dynalically cycled "on-off-on" during RF exposure and their state reported:
  • directly via communication bus
  • indirectly via cyclying the outputs (e.g. changes to PWM duty cycle, monitoring LED flash rate, inadvertent status change).
Digital Outputs are dynamically cycled "on-off-on" during RF exposure and their state reported:
  • directly via Fiber Optic system
  • indirectly via loop back method (e.g. monitoring the simulated load using a DUT input)
Communication Bus message loading
  • The analog properties of the bus electrical signal (e.g. Vdominant, Vrecessive, etc. must be validated during RF immunity.
  • This may require special software to decrease the data rate to be within the bandwidth limitations of analog fiber-optic transmitters.
RF I/O (Telematics, GPS, Wi-Fi, Bluetooth, RKE, TPMS) must be activated during EMC testing:
  • Received signals must be set to 3 dB above specified minimum sensitivity level.
  • The RF level is to be established with DUT installed in test chamber.
  • Bit Error Rate (BER) is the preferred metric with an acceptance threshold set by RF device specifications. 
  • BER must be monitored directly through the communication bus via parameter requests (never via scheduled, or periodic, broadcast messages).
  • Transmitted signals must be monitored by an appropriate RF receiver, again monitoring BER, acceptable threshold set by RF device specifications.

 

MCU Connector “Internal” I/O 

For such internal I/O (not connected to Vehicle I/O connector), the monitoring must be done via communication bus data or via indirect methods. Direct monitoring using attachments leads to external monitoring devices is not allowed.
  • MCU Analog Input is set to nominal operating value/condition for the specified test mode with the value reported either directly via the DUT communications bus or, indirectly through the DUT monitoring the input and changing the state of an output in a known, pre-determined manner. These functions are based on internal Printed Circuit Board (PCB) operating conditions and are not expected to
    be controlled or changed during testing; it is not necessary to force a mid-value for these inputs as with vehicle harness interface I/O.
  • Digital Input - Non-dynamic (Steady State I/O). Examples include feedback fault indication, over/under current monitoring via discrete comparator circuit, etc. The input is set to the nominal operating value/condition for the specified test mode with the value reported either directly via the DUT communications bus or, indirectly through the DUT monitoring the input and establishing the state of an output in a known, pre-determined manner. Not to include reset, address/data lines and communication between the microprocessor and electronically erasable programmable read-only memory (EEPROM), etc.
  • Digital State Input - Dynamic Cycling I/O. Requires state change between asserted to non-asserted back to asserted states during radiated immunity RF “on” exposure, reported directly by communication or indicate indirectly via output state change by detected input. Reset, address/data lines and communication between the micro and EEPROM are not included. The following MCU I/O types do not require direct monitoring since are indirectly monitored by the inherent operation of the device: Discrete outputs, Analog outputs, Internal communication bus.

Christian Rosu

Reference: Automotive OEM EMC specs

 

Measurement Instrumentation Uncertainty – (RE, CE-V,CE-I) Automotive Electronic Components

3. April 2023 14:29 by Christian in EMC/EMI, Test Methods, Uncertainty
CISPR 25 Conducted Emissions - Current Method - MU Sources CISPR 25 Conducted Emissions - Voltage -

CISPR 25 Conducted Emissions - Current Method - MU Sources

CISPR 25 Conducted Emissions - Voltage - MU Sources 

CISPR 25 Radiated Emissions - ALSE Method - MU Sources

CISPR 25 RF EMISSIONS INPUT QUANTITIES - PROBABILITY DISTRIBUTION FUNCTION

CISPR 25:2021

Reporting Measurement Uncertainty in automotive electronics EMC

3. April 2023 11:14 by Christian in EMC/EMI, Uncertainty
Measurement Uncertainty Budget is not a requirement imposed by any of the automotive EMC specificati

 Measurement Uncertainty Budget is not a requirement imposed by any of the automotive EMC specifications and their approved report
templates. Not all international standards behind EMC Test Methods mention the Uncertainty Budget for outlined test equipment configuration.
The OEM EMC specs are asking the use of specific test equipment approved by them and in some instances designed by them.

 

Christian Rosu, 2023-04-02

Automotive OEM Requirement for EMC Test Method Measurement Uncertainty

3. April 2023 11:01 by Christian in EMC/EMI, EMC TEST PLAN, Uncertainty
Automotive EMC/Electrical testing specs like GM3097:2019, GMW3172:2022, FMC1278:2021, FMC1279:2021,

Automotive EMC/Electrical testing specs like GM3097:2019, GMW3172:2022, FMC1278:2021, FMC1279:2021, CS0054:2018,
VW80000:2021 do not mention Measurement Uncertainty as requirement for reports.

CISPR 25:2021 includes INFORMATIVE Measurement Uncertainty but this is not a requirement for CISPR 25 compliant reports.

4.1.5 Test report
The report shall contain the information agreed upon by the customer and the supplier, e.g.
• sample identification,
• date and time of test,
• bandwidth,
• step size,
• required test limit,
• ambient data and test data.
Annex L (informative) Measurement instrumentation uncertainty – Emissions from components/modules – Test methods.
Annex M (informative) Uncertainty budgets for emissions from components/modules.

ISO 7637-2:2021 - no reference to Measurement Uncertainty.
ISO 7637-3:2016 - no reference to Measurement Uncertainty.
ISO 16750-2:2012 - no reference to Measurement Uncertainty.
ISO 16750-1:2018 - no reference to Measurement Uncertainty.


ISO 11452-2:2019 - no reference to Measurement Uncertainty.
ISO 11452-4:2020 - no reference to Measurement Uncertainty.
ISO 11452-8:2015 - no reference to Measurement Uncertainty.
ISO 11452-9:2012 - no reference to Measurement Uncertainty.
1SO 10605:2008 - no reference to Measurement Uncertainty.

Measurement Uncertainty is not a requirement for automotive electronic standards, nor a requirement of the vehicle OEMs. Measurement
Uncertainty is already included in the test levels (e.g. RE Limit Lines or RI Severity Level) for the automotive standards. These the limits are not affected by the measurement uncertainty budget generated by the laboratory for each test.

In the Commercial Electronics world (FCC & CE Mark), the Measurement Uncertainty is included in the report. This is because these
Commercial Standards require that a certain measurement uncertainty be achieved in order to apply the specified limits. If the lab's
measurement uncertainty doesn't meet the minimum requirements, then the limits must be adjusted based upon the lab's measurement
uncertainty calculations. However, this is not the case in the Automotive Industry.

Christian Rosu (Apr 2, 2023)

Automotive OEM Requirement for EMC Test Method Measurement Uncertainty

3. April 2023 11:01 by Christian in EMC/EMI, EMC TEST PLAN, Uncertainty
Automotive EMC/Electrical testing specs like GM3097:2019, GMW3172:2022, FMC1278:2021, FMC1279:2021,

Automotive EMC/Electrical testing specs like GM3097:2019, GMW3172:2022, FMC1278:2021, FMC1279:2021, CS0054:2018,
VW80000:2021 do not mention Measurement Uncertainty as requirement for reports.

CISPR 25:2021 includes INFORMATIVE Measurement Uncertainty but this is not a requirement for CISPR 25 compliant reports.

4.1.5 Test report
The report shall contain the information agreed upon by the customer and the supplier, e.g.
• sample identification,
• date and time of test,
• bandwidth,
• step size,
• required test limit,
• ambient data and test data.
Annex L (informative) Measurement instrumentation uncertainty – Emissions from components/modules – Test methods.
Annex M (informative) Uncertainty budgets for emissions from components/modules.

ISO 7637-2:2021 - no reference to Measurement Uncertainty.
ISO 7637-3:2016 - no reference to Measurement Uncertainty.
ISO 16750-2:2012 - no reference to Measurement Uncertainty.
ISO 16750-1:2018 - no reference to Measurement Uncertainty.


ISO 11452-2:2019 - no reference to Measurement Uncertainty.
ISO 11452-4:2020 - no reference to Measurement Uncertainty.
ISO 11452-8:2015 - no reference to Measurement Uncertainty.
ISO 11452-9:2012 - no reference to Measurement Uncertainty.
1SO 10605:2008 - no reference to Measurement Uncertainty.

Measurement Uncertainty is not a requirement for automotive electronic standards, nor a requirement of the vehicle OEMs. Measurement
Uncertainty is already included in the test levels (e.g. RE Limit Lines or RI Severity Level) for the automotive standards. These the limits are not affected by the measurement uncertainty budget generated by the laboratory for each test.

In the Commercial Electronics world (FCC & CE Mark), the Measurement Uncertainty is included in the report. This is because these
Commercial Standards require that a certain measurement uncertainty be achieved in order to apply the specified limits. If the lab's
measurement uncertainty doesn't meet the minimum requirements, then the limits must be adjusted based upon the lab's measurement
uncertainty calculations. However, this is not the case in the Automotive Industry.

Christian Rosu (Apr 2, 2023)